Hot Electron Modelling of HEMTs

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Hot-electron spectroscopy of GaAs.

We report results both experimental and theoretical on the dynamics of hot electron transport in GaAs. Total elastic and inelastic scattering rates are calculated and compared with the results of a new experimental technique "Hot Electron Spectroscopy". The magnetic field dependence of hot electron spectra has been studied. It is shown that application of a magnetic field normal to the injectio...

متن کامل

Electron-Electron Bremsstrahlung in a Hot Plasma

Using the differential cross section for electron-electron (e-e) bremsstrahlung exact to lowestorder perturbation theory the bremsstrahlung spectra and the total rate of energy loss of a hot electron gas are calculated. The results are compared to the nonrelativistic and extreme-relativistic approximations available and to previous work. The e-e contribution to the bremsstrahlung emission of a ...

متن کامل

Hot-electron Instability in Superconductors

High flux velocities in a superconductor can distort the quasiparticle distribution function and elevate the electronic temperature. Close to Tc, a non-thermal distribution function shrinks the vortex core producing the well-known Larkin-Ovchinnikov flux instability. In the present work we consider the opposite limit of low temperatures, where electron-electron scattering is more rapid than ele...

متن کامل

Hot-Electron Degradation of Bipolar Transistors

Hot-electron degradation of a bipolar transistor occurs when the transistor's emitterbase junction is reverse biased. Hot carriers generated by high electric fields in this junction create interface states and other defects that degrade a transistor's forwardbias current gain. This thesis aims to give the most precise microscopic description to date of reverse-bias stress of bipolar transistors...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: VLSI Design

سال: 2001

ISSN: 1065-514X,1563-5171

DOI: 10.1155/2001/57564